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Articles

Vol. 2 No. 2 (2026): Volume 2, Issue 2, 2026

A deep learning method based on SAE and LSTM for mechanical equipment anomaly detection

Submitted
June 24, 2026
Published
2026-04-11

Abstract

 Mechanical system anomalies may result in equipment failure that has major effects on 
the environment, economy, and safety. Anomaly detection for mechanical equipment often demands 
a great deal of domain expertise since many mechanical devices operate in harsh settings that make 
them susceptible to many forms of failures. However, a typical problem in many real-world 
applications is that one may not be able to get empirical information about anomalies or that the 
historical data is entirely unlabeled, rendering traditional fault detection techniques inapplicable. This 
paper fills the gap by proposing a novel deep learning-based method for anomaly detection in 
mechanical equipment. It does this by combining two types of deep learning architectures, long short 
term memory (LSTM) neural networks and stacked autoencoders (SAE), to identify anomaly 
conditions in an entirely unsupervised manner. When the historical data is unlabeled and there is no 
empirical information regarding anomalies, the suggested technique focuses on anomaly 
identification using numerous feature sequences. The effectiveness and stability of the suggested 
method are shown in an experiment for anomaly identification in rotary equipment using wavelet 
packet decomposition (WPD) and data-driven models. The two phases of the process are LSTM
based anomaly detection and SAE-based multiple feature sequence representation. Fivefold cross
validation was used throughout the experiment to verify the stability and effectiveness of the 
suggested method. The findings demonstrate that the suggested strategy may identify anomalous 
working conditions with 99% accuracy in an entirely unsupervised learning environment and provide 
a different way to use and incorporate characteristics for anomaly identification without the need for 
empirical information.